1 GENERAL OVERVIEW
18
Data analysis
Port impedance
conversion
The function of conversion of the S-parameters
measured at 50 port into the values, which could be
determined if measured at a test port with arbitrary
impedance.
De-embedding The function allows to mathematically exclude from
the measurement result the effect of the fixture circuit
connected between the calibration plane and the
DUT. This circuit should be described by an S-
parameter matrix in a Touchstone file.
Embedding The function allows to mathematically simulate the
DUT parameters after virtual integration of a fixture
circuit between the calibration plane and the DUT.
This circuit should be described by an S-parameter
matrix in a Touchstone file.
S-parameter conversion The function allows conversion of the measured S-
parameters to the following parameters: reflection
impedance and admittance, transmission impedance
and admittance, and inverse S-parameters.
Time domain
transformation
The function performs data transformation from
frequency domain into response of the DUT to
various stimulus types in time domain. Modeled
stimulus types: bandpass, lowpass impulse, and
lowpass step. Time domain span is set by the user
arbitrarily from zero to maximum, which is
determined by the frequency step. Windows of
various forms for better tradeoff between resolution
and level of spurious sidelobes.
Time domain gating The function mathematically removes unwanted
responses in time domain what allows for obtaining
frequency response without influence from the fixture
elements. The function applies reverse transformation
back to frequency domain to the user-defined span in
time domain. Gating filter types: bandpass or notch.
For better tradeoff between gate resolution and level
of spurious sidelobes the following filter shapes are
available: maximum, wide, normal and minimum.
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